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Vlsi Test Principles Architectures (12 results)
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Condition: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
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Condition: Like New. hardcover. Page block firm and clean, binding unblemished, boards straight, without markings of any kind. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.
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Condition: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.
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VLSI Test Principles and Architectures,: Design for Testability (Systems on Silicon)
Language: English
Published by Morgan Kaufmann 2006-08-14, 2006
ISBN 10: 0123705975 ISBN 13: 9780123705976
£ 57.20
£ 15.49 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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Condition: New. pp. xxx + 777 Illus.
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Hardcover. Condition: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock.
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Condition: New. pp. xxx + 777.
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Condition: New. pp. xxx + 777.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Paperback. Condition: Brand New. 1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.
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VLSI Test Principles and Architectures: Design for Testability
Language: English
Published by Morgan Kaufmann Publishers, 2006
ISBN 10: 1493300865 ISBN 13: 9781493300860
Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
