VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) Wang, Laung-Terng, Cheng-Wen Wu and Xiaoqing Wen

Wang, Laung-Terng, Cheng-Wen Wu and Xiaoqing Wen

ISBN 10: 0123705975 ISBN 13: 9780123705976
Published by Morgan Kaufmann, 2006
Language: English
Condition: Used - Very good Hardcover

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Used - Hardcover

Condition: Used - Very good

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