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Transmission Electron Microscopy Diffractometry by Fultz Brent (34 results)
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Softcover. Condition: Fair. Spuren von Feuchtigkeit / Nässe; Leichte Kratzer / Abnutzungen / Druckstellen; Gebrochener Buchrücken. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
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Transmission Electron Microscopy and Diffractometry of Materials.
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
Hardcover. Condition: Wie neu. 778 S., Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1355 3rd corrected Ed. 2008, corr. 2nd printing 2009.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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hardcover. Condition: Gut. 778 Seiten; 9783540738855.3 Gewicht in Gramm: 2.
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hardcover. Condition: Befriedigend. 778 Seiten; 9783540738855.4 Gewicht in Gramm: 2.
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hardcover. Condition: Befriedigend. 767 Seiten; 9783540678410.4 Gewicht in Gramm: 2.
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hardcover. Condition: Gut. 767 Seiten; 9783540678410.3 Gewicht in Gramm: 2.
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Book 38 of 126: Graduate Texts in PhysicsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 76.40
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Transmission Electron Microscopy and Diffractometry of Materials
Book 38 of 126: Graduate Texts in PhysicsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Hardcover. Condition: New. 3rd Edition. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Book 38 of 126: Graduate Texts in PhysicsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 107.12
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Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Language: English
Published by Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851 ISBN 13: 9783540738855
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 4 out of 5 stars
Hardcover. Condition: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Taschenbuch. Condition: Neu. Transmission Electron Microscopy and Diffractometry of Materials | Brent Fultz (u. a.) | Taschenbuch | Graduate Texts in Physics | xx | Englisch | 2014 | Springer | EAN 9783642433153 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Transmission Electron Microscopy and Diffractometry of Materials
Book 38 of 126: Graduate Texts in PhysicsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 122.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Paperback. Condition: Brand New. 4th edition. 784 pages. 9.25x6.10x1.65 inches. In Stock.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Transmission Electron Microscopy and Diffractometry of Materials
Book 38 of 126: Graduate Texts in PhysicsLanguage: English
Published by Springer, Springer Spektrum, 2012
ISBN 10: 3642297609 ISBN 13: 9783642297601
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Print on Demand.
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Transmission Electron Microscopy and Diffractometry of Materials
Book 38 of 126: Graduate Texts in PhysicsLanguage: English
Published by Springer Berlin Heidelberg, 2014
ISBN 10: 3642433154 ISBN 13: 9783642433153
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .
