Synopsis
This text covers the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail.
Review
"I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."(John Hutchison in Journal of Microscopy)"I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization."(Ray Egerton in Micron)"A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience."(John C. H. Spence, Arizona State University)"I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending this book for my course. It is a superb book."(Colin Humphries, Cambridge University)"This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended."(Ronald Gronsky, University of California, Berkeley) From the reviews of the second edition: "Transmission Electron Microscopy and Diffractometry of Materials has only been out since 2001 a ] but so well has it sold that B. Fultz and J. Howe have already produced a revised edition, the revisions a ~ranging from substantial re-structuring to subtle rewordinga (TM). a ] I must insist thatthis text represents an enormous amount of work, it is densely filled, well-illustrated and carefully organized. It should be on a shelf in all electron microscopy laboratories a ] ." (Ultramicroscopy, Vol. 99, 2004) "The book by Fultz and Howe, now in its second edition, is part of a programme of advanced texts covering topics of current and emerging interest in physics. a ] Each chapter is accompanied by several problems suitable for a written examination. The contents are very comprehensive a ] . My impression is that the book will serve as a useful reference work, as well as a core textbook for graduate students." (Professor L. M. Brown, Contemporary Physics, Vol. 44 (6), 2003) "The main objective of the present book is teaching. a ] Each chapter concludes with a number of problems to be solved by students. Furthermore the appendix contains valuable information in the form of tables and graphs, and also practical hints for daily laboratory work, which might be useful for accreditation procedures. The book can be highly recommended a ] ." (W. Oesterle, Werkstoffe und Korrosion, Issue 9, 2003)
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