Testing Static Random Access by Hamdioui Said (27 results)
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contact seller5-star sellerCondition: Used - Good
£ 56.90
£ 2.80 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 93.82
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerCondition: New
£ 95.86
Free ShippingShips within U.S.A.Quantity: 1 available
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
Contact seller4-star sellerCondition: New
£ 101.62
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 96.88
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 96.88
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 95.48
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 124.64
£ 2.98 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 244.
Language: English
Published by Springer Verlag, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 127.76
£ 10.00 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 240 pages. 9.25x6.10x0.55 inches. In Stock.
Language: English
Published by Springer US, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 98.99
£ 52.74 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge n…eeded by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Language: English
Published by Springer US, Copernicus, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 100.39
£ 53.42 shippingShips from Germany to U.S.A.Quantity: 1 available
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed b…y those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 200.99
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 193.00
£ 25.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 228.46
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller5-star sellerCondition: New
£ 75.71
£ 4.69 shippingShips from Italy to U.S.A.Quantity: Over 20 available
Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
Contact seller5-star sellerCondition: New
£ 85.61
Free ShippingShips within U.S.A.Quantity: 10 available
Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
Language: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
Contact seller5-star sellerCondition: New
£ 85.61
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
Language: English
Published by Springer US Mrz 2004, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
£ 93.92
£ 19.60 shippingShips from Germany to U.S.A.Quantity: 2 available
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical ackn…owledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing. 244 pp. Englisch.
Language: English
Published by Springer US, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 81.00
£ 41.75 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing Static Random Access Memories covers testing of one of the important semiconductor memories types it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes…to the technical ackno.
Language: English
Published by Springer US, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 81.00
£ 41.75 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing Static Random Access Memories covers testing of one of the important semiconductor memories types it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It co…ntributes to the technical ackno.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 128.84
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 244 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 134.07
£ 8.48 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 244.
More imagesLanguage: English
Published by Springer, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
£ 84.01
£ 59.66 shippingShips from Germany to U.S.A.Quantity: 5 available
Buch. Condition: Neu. Testing Static Random Access Memories | Defects, Fault Models and Test Patterns | Said Hamdioui | Buch | Frontiers in Electronic Testing | xx | Englisch | 2004 | Springer | EAN 9781402077524 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[…at]springer[dot]com | Anbieter: preigu Print on Demand.
More imagesLanguage: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
£ 84.01
£ 59.66 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Testing Static Random Access Memories | Defects, Fault Models and Test Patterns | Said Hamdioui | Taschenbuch | Frontiers in Electronic Testing | xx | Englisch | 2010 | Springer | EAN 9781441954305 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen…[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Language: English
Published by Springer US, Copernicus Mär 2004, 2004
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
£ 93.92
£ 51.14 shippingShips from Germany to U.S.A.Quantity: 1 available
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowle…dge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed.Features:Fault primitive based analysis of memory faultsA complete framework of and classification memory faultsA systematic way to develop optimal and high quality memory test algorithmsA systematic way to develop test patterns for any multi-port SRAMChallenges and trends in embedded memory testing.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch.
Language: English
Published by Springer US, Springer US Dez 2010, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
£ 93.92
£ 51.14 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical a…cknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 244 pp. Englisch.
Language: English
Published by Springer US Dez 2010, 2010
Series: Frontiers in Electronic Testing, Book 38 of 40. Book 38 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
£ 136.15
£ 19.60 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technic…al acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing. 244 pp. Englisch.
