Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing, 26)

Book 38 of 40: Frontiers in Electronic Testing

Hamdioui, Said

ISBN 10: 1402077521 ISBN 13: 9781402077524
Published by Springer, 2004
Language: English
Condition: New Hardcover

Sold by Ria Christie Collections, Uxbridge, United Kingdom

AbeBooks Seller since 25 March 2015

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


New - Hardcover

Condition: New

Price:
£ 94.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.

Quantity: Over 20 available

Add to basket