Test Diagnosis Small Delay Defects by Tehranipoor Mohammad (20 results)

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Hardcover. Condition: Brand New. 212 pages. 9.25x6.25x0.50 inches. In Stock.

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Taschenbuch. Condition: Neu. Test and Diagnosis for Small-Delay Defects | Mohammad Tehranipoor (u. a.) | Taschenbuch | xviii | Englisch | 2014 | Springer | EAN 9781489989529 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. 232 pp. Englisch.…

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. 232 pp. Englisch.…

Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and. …

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 232 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 232 pp. Englisch.…

Condition: New. Print on Demand pp. 232.

Condition: New. PRINT ON DEMAND pp. 232.