Test and Diagnosis for Small-Delay Defects

Language: English

Published by Springer New York, 2011

1441982965 / 9781441982964

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.

Seller Inventory # 4176570

Title
Test and Diagnosis for Small-Delay Defects
Author
Mohammad Tehranipoor|Ke Peng|Krishnendu Chakrabarty
Publisher
Springer New York
Publication year
2011
Condition
New
Binding
Gebunden
Language
English
ISBN 10
1441982965
ISBN 13
9781441982964

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

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Moluna GmbH

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