Reflection Electron Microscopy Spectroscopy Surface by Zhong Lin Wang (26 results)

Condition: New.

Condition: New.

Condition: New.

Condition: New. In English.

Condition: New.

Condition: As New. Unread book in perfect condition.

paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condition: As New. Unread book in perfect condition.

Condition: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . . …

Condition: New. In English.

Condition: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . . Books ship from the US and Ireland. …

Hardcover. Condition: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock.

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.…

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condition: Fine. First edition hard back binding in publisher's original black paper covers, gilt title and author lettering to the spine. Quarto 10'' x 7''. Contains [xix] 436 printed pages of text with monochrome illustrations and photographs throughout. Fine condition book in Fine condition dust wrapper. Dust wrapper supplied in archive acetate film protection, this preserves and prolongs the life of the paper, it is not adhered to the book or to the dust wrapper. Member of the P.B.F.A. ISBN 0521482666 MICROBIOLOGICAL.…

Condition: New. Print on Demand pp. 460 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

Condition: New. Print on Demand pp. 460.

Condition: New. PRINT ON DEMAND pp. 460.

Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Paperback. Condition: new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat. …

Taschenbuch. Condition: Neu. Reflection Electron Microscopy and Spectroscopy for Surface Analysis | Zhong Lin Wang (u. a.) | Taschenbuch | Kartoniert / Broschiert | Englisch | 2005 | Cambridge University Press | EAN 9780521017954 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…

Hardcover. Condition: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat. …

Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Buch. Condition: Neu. Reflection Electron Microscopy and Spectroscopy for Surface Analysis | Zhong Lin Wang | Buch | Gebunden | Englisch | 2015 | Cambridge University Press | EAN 9780521482660 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…