Reflection Electron Microscopy and spectotrophy for surface analysis - Softcover

Wang, Zhong Lin

Softcover

ISBN 10: 0521017955 ISBN 13: 9780521017954

Publisher: Cambridge University Press, 2008

Synopsis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

About this title

Review

'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology

'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst

' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy

' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

Book Description

Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

Edition details

• Publisher: Cambridge University Press
• Publication date: 2008
• Language: English
• ISBN 10: 0521017955
• ISBN 13: 9780521017954
• Binding: Paperback
• Number of pages: 460