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Quantitative X Ray Diffractometry by Zevin Lev (14 results)
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Dec 06, 1995. Condition: Used: Good. Quantitative X-Ray Diffractometry | Zevin - Kimmel | Springer Verlag New-York Berlin, 1995, in-8° cartonnage éditeur de 372 pages. Couverture propre. Dos solide. Intérieur frais sans soulignage ou annotation. Exemplaire de bibliothèque : petit code barre en pied de 1re de couv., cotation au dos, rares et discrets petits tampons à l'intérieur de l'ouvrage. Très bon état général pour cet ouvrage. [T12].
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Hardcover. XVII, 372 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16139 9780387945415 Sprache: Englisch Gewicht in Gramm: 550.
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Dec 06, 1995. Condition: gebraucht; sehr gut. Hardcover, 1995, Bibliothekstempel am Vorsatzblatt-Innenseite, ansonsten ungebraucht.
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Quantitative X-Ray Diffractometry
Book 1 of 55: Contributions to Political ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Taschenbuch. Condition: Neu. Quantitative X-Ray Diffractometry | Lev S. Zevin (u. a.) | Taschenbuch | xvii | Englisch | 2011 | Springer New York | EAN 9781461395379 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Paperback. Condition: Brand New. reprint edition. 389 pages. 9.50x6.75x1.00 inches. In Stock.
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Quantitative X-Ray Diffractometry
Book 1 of 55: Contributions to Political ScienceLanguage: English
Published by Springer New York, Springer New York, 2011
ISBN 10: 1461395372 ISBN 13: 9781461395379
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Condition: new. Questo è un articolo print on demand.
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Quantitative X-Ray Diffractometry
Book 1 of 55: Contributions to Political ScienceLanguage: English
Published by Springer New York Dez 2011, 2011
ISBN 10: 1461395372 ISBN 13: 9781461395379
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers. 396 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase.
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Quantitative X-Ray Diffractometry
Book 1 of 55: Contributions to Political ScienceLanguage: English
Published by Springer New York, Springer New York Dez 2011, 2011
ISBN 10: 1461395372 ISBN 13: 9781461395379
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 396 pp. Englisch.
