Quantitative X-Ray Diffractometry

Language: English

Published by Springer New York, Springer New York Dez 2011, 2011

1461395372 / 9781461395379

Series: Book 1 of 55 - Contributions to Political Science

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This item is printed on demand - Print on Demand Titel. Neuware -One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 396 pp. Englisch.

Seller Inventory # 9781461395379

Title
Quantitative X-Ray Diffractometry
Author
Lev S. Zevin
Publisher
Springer New York, Springer New York Dez 2011
Publication year
2011
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1461395372
ISBN 13
9781461395379
Item weight
681 grams
Dimensions
244x170x22 mm
Series
Book 1 of 55: Contributions to Political Science

buchversandmimpf2000

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