Quantitative X-Ray Diffractometry

Language: English

Published by Springer New York, 2011

1461395372 / 9781461395379

Series: Book 1 of 55 - Contributions to Political Science

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase.

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Title
Quantitative X-Ray Diffractometry
Author
Lev S. Zevin|Giora Kimmel
Publisher
Springer New York
Publication year
2011
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1461395372
ISBN 13
9781461395379
Series
Book 1 of 55: Contributions to Political Science

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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