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Quantitative Atomic-resolution Electron Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 185.05
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Condition: As New. Unread book in perfect condition.
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Quantitative Atomic-resolution Electron Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 221.65
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Quantitative Atomic-Resolution Electron Microscopy
Language: English
Published by Elsevier Science Publishing Co Inc, US, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
£ 248.27
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Add to basketHardback. Condition: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
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Quantitative Atomic-Resolution Electron Microscopy
Language: English
Published by Elsevier Science Publishing Co Inc, US, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
£ 227.28
£ 65 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Quantitative Atomic-Resolution Electron Microscopy (Volume 217) (Advances in Imaging and Electron Physics, Volume 217)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 197.89
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Quantitative Atomic-Resolution Electron Microscopy
Language: English
Published by Elsevier Science & Technology|Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Gebunden. Condition: New. Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical .
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Condition: new. Questo č un articolo print on demand.
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Quantitative Atomic-Resolution Electron Microscopy
Language: English
Published by Elsevier Science & Technology, Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Englisch.
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Hardcover. Condition: Brand New. 232 pages. 9.00x6.00x0.79 inches. In Stock. This item is printed on demand.
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Quantitative Atomic-Resolution Electron Microscopy
Language: English
Published by Elsevier Science & Technology, Academic Press, 2021
ISBN 10: 0128246073 ISBN 13: 9780128246078
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
