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Power Constrained Testing Vlsi Circuits by Nicolici Nicola (21 results)
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Hardcover. Condition: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10.
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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Book 11 of 40: Frontiers in Electronic TestingSeller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. *FREE DOMESTIC SHIPPING UNTIL MONDAY, NOV. 24* 178 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
Book 11 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
Book 11 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Power-constrained Testing of Vlsi Circuits
Book 11 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. pp. 192.
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Paperback. Condition: Brand New. 180 pages. 9.25x6.10x0.44 inches. In Stock.
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Power-constrained Testing of Vlsi Circuits
Book 11 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Paperback. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Condition: New. pp. 192.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu.
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Condition: New. Print on Demand pp. 192 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Book 11 of 40: Frontiers in Electronic TestingPublished by Springer-Verlag New York Inc., 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 1020.
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Condition: New. PRINT ON DEMAND pp. 192.
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Condition: New. Print on Demand pp. 192 Illus.
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Condition: New. PRINT ON DEMAND pp. 192.
