Items related to Power-Constrained Testing of VLSI Circuits: A Guide...

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing, 22B) - Hardcover

 
9781402072352: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing, 22B)

Synopsis

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.

Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.

"synopsis" may belong to another edition of this title.

Synopsis

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density. "Power-Constrained Testing of VLSI Circuits" focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.

"About this title" may belong to another edition of this title.

Buy Used

Condition: Good
178 pp., Hardcover, ex library...
View this item

£ 13.48 shipping from U.S.A. to United Kingdom

Destination, rates & speeds

Other Popular Editions of the Same Title

9781441953155: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing, 22B)

Featured Edition

ISBN 10:  1441953159 ISBN 13:  9781441953155
Publisher: Springer, 2010
Softcover

Search results for Power-Constrained Testing of VLSI Circuits: A Guide...

Stock Image

Nicolici, Nicola, Al-Hashimi, Bashir M.
Published by Kluwer, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Used Hardcover

Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: Good. 178 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Seller Inventory # ZB1126153

Contact seller

Buy Used

£ 30.11
Convert currency
Shipping: £ 13.48
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Nicolici, Nicola; Al-Hashimi, Bashir M.
Published by Springer, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Used Hardcover

Seller: CONTINENTAL MEDIA & BEYOND, Ocala, FL, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Hardcover. Condition: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10. Seller Inventory # 0727IYQ8381

Contact seller

Buy Used

£ 24.62
Convert currency
Shipping: £ 28.45
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Nicolici, Nicola; Al-Hashimi, Bashir M.
Published by Springer, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover

Seller: Ria Christie Collections, Uxbridge, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. In. Seller Inventory # ria9781402072352_new

Contact seller

Buy New

£ 94.13
Convert currency
Shipping: FREE
Within United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Nicola Nicolici|Bashir M. Al-Hashimi
Published by Springer US, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover
Print on Demand

Seller: moluna, Greven, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for redu. Seller Inventory # 4094936

Contact seller

Buy New

£ 82.98
Convert currency
Shipping: £ 21.82
From Germany to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Bashir M. Al-Hashimi
Published by Springer US, Springer New York, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover

Seller: AHA-BUCH GmbH, Einbeck, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented. Seller Inventory # 9781402072352

Contact seller

Buy New

£ 102.85
Convert currency
Shipping: £ 12.22
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Nicola Nicolici
Published by Springer-Verlag New York Inc., 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover
Print on Demand

Seller: THE SAINT BOOKSTORE, Southport, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 1020. Seller Inventory # C9781402072352

Contact seller

Buy New

£ 115.59
Convert currency
Shipping: FREE
Within United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Bashir M. Al-Hashimi
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover
Print on Demand

Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 192 pp. Englisch. Seller Inventory # 9781402072352

Contact seller

Buy New

£ 96.22
Convert currency
Shipping: £ 30.56
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Nicolici, Nicola; Al-Hashimi, Bashir M.
Published by Springer, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover

Seller: Lucky's Textbooks, Dallas, TX, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # ABLIING23Mar2411530144564

Contact seller

Buy New

£ 89.78
Convert currency
Shipping: £ 56.15
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Bashir M. Al-Hashimi
Published by Springer US Feb 2003, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
New Hardcover
Print on Demand

Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. 192 pp. Englisch. Seller Inventory # 9781402072352

Contact seller

Buy New

£ 144.29
Convert currency
Shipping: £ 9.60
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 2 available

Add to basket