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Power Aware Testing Test Strategies (22 results)
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Condition: New.
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Power-Aware Testing and Test Strategies for Low Power Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Condition: New. pp. 388.
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Condition: New.
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Power-Aware Testing and Test Strategies for Low Power Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Taschenbuch. Condition: Neu. Power-Aware Testing and Test Strategies for Low Power Devices | Patrick Girard (u. a.) | Taschenbuch | xxi | Englisch | 2014 | Springer US | EAN 9781489983138 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Power-Aware Testing and Test Strategies for Low Power Devices
Published by Springer US, Springer New York, 2014
ISBN 10: 1489983139 ISBN 13: 9781489983138
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
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Paperback. Condition: Like New. Like New. book.
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Condition: New. pp. 388.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Power-Aware Testing and Test Strategies for Low Power Devices
Published by Springer US Sep 2014, 2014
ISBN 10: 1489983139 ISBN 13: 9781489983138
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 388 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Is the only comprehensive book on power-aware test for (low power) circuits and systemsInstructs readers how low-power devices can be tested safely without affecting yield and reliabilityIncludes necessary background information on design f.
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Condition: New. Print on Demand pp. 388.
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Condition: New. PRINT ON DEMAND pp. 388.
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Power-Aware Testing and Test Strategies for Low Power Devices
Published by Springer US, Springer New York Sep 2014, 2014
ISBN 10: 1489983139 ISBN 13: 9781489983138
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 388 pp. Englisch.
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Power-Aware Testing and Test Strategies for Low Power Devices
Published by SPRINGER NATURE Nov 2009, 2009
ISBN 10: 1441909273 ISBN 13: 9781441909275
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 363 pp. Englisch.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Is the only comprehensive book on power-aware test for (low power) circuits and systemsInstructs readers how low-power devices can be tested safely without affecting yield and reliabilityIncludes necessary background information on design f.
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Condition: New. Print on Demand pp. 388 Illus.
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Condition: New. PRINT ON DEMAND pp. 388.
