Power-Aware Testing and Test Strategies for Low Power Devices

Language: English

Published by Springer US Sep 2014, 2014

1489983139 / 9781489983138

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Softcover

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This item is printed on demand - it takes 3-4 days longer - Neuware -Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 388 pp. Englisch.

Title
Power-Aware Testing and Test Strategies for Low Power Devices
Author
Patrick Girard
Publisher
Springer US Sep 2014
Publication year
2014
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1489983139
ISBN 13
9781489983138
Item weight
587 grams
Dimensions
235x155x21 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

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