Fundamentals Solid State Electronics Solution by Sah Chih Tang (11 results)

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  • Language: English

    Published by World Scientific Publishing Comp, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: The Book Corner, Beaverton, OR, U.S.A.The Book Corner

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    Condition: Used - Fair

    £ 21.60

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    paperback. Condition: Acceptable. Paperback. Cover and spine in good condition. Spine is tight. Pages are clean, no markings, notes or stains. The book itself is bowed but perfectly good. Ships from Friends bookstore to benefit Beaverton (Oregon) library.

  • Language: English

    Published by World Scientific Publishing Company, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    £ 30.10

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    Condition: New.

  • Language: English

    Published by World Scientific Publishing Company, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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    Condition: Used - As new

    £ 33.12

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    Condition: As New. Unread book in perfect condition.

  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, Singapore, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail

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    £ 36.22

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    Paperback. Condition: new. Paperback. This companion to "Fundamentals of Solid-State Electronics - Study Guide" provides the solutions to selected problems listed in the book. Most of the solutions are for selected assigned problems from an introductory device core course taught to engineering undergraduates at the University of Florida from 1991 to 1996. The manual also contains an extensive appendix on state-of-the-art transistor reliability physics and engineering discussions and solutions which have been taught to advanced undergraduate and graduate students at that university. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Language: English

    Published by World Scientific Publishing Company, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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    £ 31.97

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    Condition: New.

  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.

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    Condition: New

    £ 41.35

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    Condition: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . .

  • Language: English

    Published by World Scientific Publishing Company, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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    Condition: Used - As new

    £ 37.34

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    Condition: As New. Unread book in perfect condition.

  • Language: English

    Published by World Scientific Pub Co Inc, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    £ 40.79

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    Paperback. Condition: Brand New. 200 pages. 9.00x6.25x0.75 inches. In Stock.

  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore

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    £ 48.90

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    Condition: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . . Books ship from the US and Ireland.

  • Language: English

    Published by WORLD SCIENTIFIC PUB CO INC, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: moluna, Greven, Germanymoluna

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    £ 35.73

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    Condition: New. KlappentextrnrnAccompanying the Study Guide , this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for adva.

  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, Singapore, 1996

    9810228813 / 9789810228811

    • Softcover

    Seller: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

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    £ 61.28

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    Paperback. Condition: new. Paperback. This companion to "Fundamentals of Solid-State Electronics - Study Guide" provides the solutions to selected problems listed in the book. Most of the solutions are for selected assigned problems from an introductory device core course taught to engineering undergraduates at the University of Florida from 1991 to 1996. The manual also contains an extensive appendix on state-of-the-art transistor reliability physics and engineering discussions and solutions which have been taught to advanced undergraduate and graduate students at that university. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.