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Advanced Computing in Electron Microscopy
Language: English
Published by Springer-Verlag Publishing, 2010
ISBN 10: 1441965327 ISBN 13: 9781441965325
Condition: Like New. 2. Fine/As New; Hardcover; 2nd Edition; This book is brand new and still sealed in the publisher's original shrinkwrap; Perfect, new condition; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.8 lbs; Dark orange covers with title in white lettering; 2010, Springer-Verlag Publishing; 289 pages; "Advanced Computing in Electron Microscopy," by Earl J. Kirkland.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Advanced Computing in Electron Microscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 107.12
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Advanced Computing in Electron Microscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Advanced Computing in Electron Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 127.59
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Condition: As New. Unread book in perfect condition.
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Paperback. Condition: Brand New. 2nd edition. 299 pages. 9.25x6.10x0.68 inches. In Stock.
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Taschenbuch. Condition: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | x | Englisch | 2014 | Springer | EAN 9781489995094 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Advanced Computing in Electron Microscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 141.05
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Advanced Computing in Electron Microscopy
Language: English
Published by Springer Nature Switzerland AG, CH, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
£ 166.90
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Add to basketHardback. Condition: New. Third Edition 2020.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld.
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Paperback. Condition: Like New. Like New. book.
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Condition: New.
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Taschenbuch. Condition: Neu. Advanced Computing in Electron Microscopy | Earl J. Kirkland | Taschenbuch | xii | Englisch | 2021 | Springer | EAN 9783030332624 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
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Advanced Computing in Electron Microscopy
Language: English
Published by Springer Nature Switzerland AG, CH, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
£ 153.81
£ 65 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. Third Edition 2020.
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Paperback. Condition: Brand New. 3rd edition. 368 pages. 9.25x6.10x0.79 inches. In Stock.
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Hardcover. Condition: Brand New. 3rd edition. 354 pages. 9.25x6.00x1.00 inches. In Stock.
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Hardcover. Condition: New. New. book.
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Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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Advanced Computing in Electron Microscopy
Language: English
Published by Springer US Okt 2014, 2014
ISBN 10: 1489995099 ISBN 13: 9781489995094
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld. 300 pp. Englisch.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book features numerical computation of electron microscopy images as well as multislice methodsHigh resolution CTEM and STEM image interpretation are included in the textThis newly updated second edition will bring the reader up to dat.
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Advanced Computing in Electron Microscopy
Language: English
Published by Springer, Springer Okt 2014, 2014
ISBN 10: 1489995099 ISBN 13: 9781489995094
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/żkirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 300 pp. Englisch.
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Advanced Computing in Electron Microscopy
Language: English
Published by Springer International Publishing, Springer International Publishing Mär 2020, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.
-
Advanced Computing in Electron Microscopy
Language: English
Published by Springer International Publishing, 2020
ISBN 10: 3030332594 ISBN 13: 9783030332594
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.
