9781489986306 - Analog Ic Reliability in Nanometer Cmos (analog Circuits and Signal Processing) by Maricau, Elie; Gielen, Georges (16 results)
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
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Condition: New. pp. 198.
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Analog IC Reliability in Nanometer CMOS | Elie Maricau (u. a.) | Taschenbuch | xvi | Englisch | 2015 | Springer | EAN 9781489986306 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Language: English
Published by Springer, Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are d…iscussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
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Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.
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Language: English
Published by Springer New York Jun 2015, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit…simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. 216 pp. Englisch.
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Language: English
Published by Springer New York, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Enables readers to understand long-term reliability of an integrated circuit Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes Provides overview of models for key aging effe…cts, as well as compact.
Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 198.
Language: English
Published by Springer, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 198.
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Language: English
Published by Springer, Springer Jun 2015, 2015
Series: Book 57 of 124 - Analog Circuits and Signal Processing
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simu…lation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 216 pp. Englisch.
