Analog IC Reliability in Nanometer CMOS

Language: English

Published by Springer New York, 2015

1489986308 / 9781489986306

Series: Book 57 of 124 - Analog Circuits and Signal Processing

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Enables readers to understand long-term reliability of an integrated circuit Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes Provides overview of models for key aging effects, as well as compact.

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Title
Analog IC Reliability in Nanometer CMOS
Author
Elie Maricau|Georges Gielen
Publisher
Springer New York
Publication year
2015
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1489986308
ISBN 13
9781489986306
Series
Book 57 of 124: Analog Circuits and Signal Processing

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
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