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9781441982964 - Test and Diagnosis for Small-delay Defects by Tehranipoor, Mohammad; Peng, Ke; Chakrabarty, Krishnendu (12 results)
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 101.88
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 106.60
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 126.63
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Hardcover. Condition: Brand New. 212 pages. 9.25x6.25x0.50 inches. In Stock.
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Test and Diagnosis for Small-Delay Defects
Language: English
Published by Springer New York, Springer New York, 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
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Condition: new. Questo è un articolo print on demand.
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Test and Diagnosis for Small-Delay Defects
Language: English
Published by Springer New York, Springer New York Sep 2011, 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. 232 pp. Englisch.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.
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Buch. Condition: Neu. Test and Diagnosis for Small-Delay Defects | Mohammad Tehranipoor (u. a.) | Buch | xviii | Englisch | 2011 | Springer | EAN 9781441982964 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Test and Diagnosis for Small-Delay Defects
Language: English
Published by Springer, Springer Sep 2011, 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 232 pp. Englisch.
