9781402080913 - Static Crosstalk-noise Analysis: for Deep Sub-micron Digital Designs (solid Mechanics & Its Applications S) by Pinhong Chen; Kirkpatrick, Desmond A.; Keutzer, Kurt (21 results)

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  • Language: English

    Published by Springer, 2004

    1402080913 / 9781402080913

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    Hardcover. Condition: Very Good. No Jacket. The binding is tight and the spine is smooth. The cover has a couple of minor dents along the lower half in front and a slight dent along the front edge, near the middle. The bottom corners are lightly bumped. The pages are clean and unmarked and the book appears to be only lightly use

  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

    Published by Springer, 2004

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  • Language: English

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    Condition: New. pp. 132.

  • Language: English

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally,

  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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    Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditio

  • Language: English

    Published by SPRINGER, 2004

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    Condition: New Books. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested

  • Language: English

    Published by Springer US Jun 2004, 2004

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation.

  • Language: English

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues a

  • Language: English

    Published by Springer, 2004

    1402080913 / 9781402080913

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    Condition: New. Print on Demand pp. 132 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

  • Language: English

    Published by Springer, 2004

    1402080913 / 9781402080913

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    Condition: New. PRINT ON DEMAND pp. 132.

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    Language: English

    Published by Copernicus, 2004

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    Buch. Condition: Neu. Static Crosstalk-Noise Analysis | For Deep Sub-Micron Digital Designs | Pinhong Chen (u. a.) | Buch | xviii | Englisch | 2004 | Copernicus | EAN 9781402080913 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter:

  • Language: English

    Published by Springer US, Copernicus Jun 2004, 2004

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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Tra