ISBN: 9781107409484 - Materials Reliability in Microelectronics Iii: Volume 309 (mrs Proceedings) (16 results)
Materials Reliability in Microelectronics III
Rodbell, Kenneth P. (EDT); Filter, William F. (EDT); Frost, Harold J. (EDT); Ho, Paul S. (EDT)
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Paperback or Softback. Condition: New. Materials Reliability in Microelectronics III: Volume 309. Book.
Materials Reliability in Microelectronics III
Rodbell, Kenneth P. (EDT); Filter, William F. (EDT); Frost, Harold J. (EDT); Ho, Paul S. (EDT)
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Materials Reliability in Microelectronics III
Rodbell, Kenneth P. (EDT); Filter, William F. (EDT); Frost, Harold J. (EDT); Ho, Paul S. (EDT)
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Materials Reliability in Microelectronics III
Rodbell, Kenneth P. (EDT); Filter, William F. (EDT); Frost, Harold J. (EDT); Ho, Paul S. (EDT)
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Materials Reliability in Microelectronics III
Ho Paul S. Frost Harold J. Filter William F. Rodbell Kenneth P.
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Paperback. Condition: new. Paperback. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.KlappentextThe MRS Symposium Proceeding series is an internationally recognised reference suitable for research.…
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Taschenbuch. Condition: Neu. Materials Reliability in Microelectronics III | Volume 309 | Kenneth P. Rodbell (u. a.) | Taschenbuch | Kartoniert / Broschiert | Englisch | 2012 | Cambridge University Press | EAN 9781107409484 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…
