Materials Reliability in Microelectronics III

Ho Paul S. Frost Harold J. Filter William F. Rodbell Kenneth P.

ISBN 10: 1107409489 ISBN 13: 9781107409484

Published by Cambridge University Press, 2014

Language: English

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Bibliographic Details

Title: Materials Reliability in Microelectronics III
Publisher: Cambridge University Press
Publication Date: 2014
Language: English
ISBN 10: 1107409489
ISBN 13: 9781107409484
Binding: Soft cover
Condition: New

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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