ISBN: 9780306449017 - Advances in X-ray Analysis: Volume 37: Vol.37 (advances in X-ray Analysis: Proccedings of the Forty-second Annual Conference on Applications of X-ray Analysis Held in Denver, Colorado, August 2-6,) (11 results)

Advances in X-Ray Analysis, Vol. 37
Noyan, I C; Gilfrich; Huang, T C; Goldsmith, Charles C; Gilfrich, J V; Gilfrich, John V; Goldsmith, C C; Huang, Ting C; Jenkins MS, Ron; Noyan, I Cev
Language: English
Published by Kluwer Academic Publishers (edition 1), 1994
- Hardcover
Seller: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contact seller5-star sellerCondition: Used - Very good
£ 49.47
Free ShippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Very Good. 1. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
Contact seller5-star sellerCondition: New
£ 63.69
Free ShippingShips within U.S.A.Quantity: 1 available
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerCondition: New
£ 65.15
Free ShippingShips within U.S.A.Quantity: 1 available
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: Used
£ 93.03
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Used. pp. 778.

- Hardcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: Used
£ 97.00
£ 3.01 shippingShips within U.S.A.Quantity: 1 available
Condition: Used. pp. 778 1st Edition.

- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: Used
£ 97.36
£ 8.32 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Used. pp. 778.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 86.42
£ 18.33 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.

Advances in X-ray Analysis
Gilfrich, John V.|Goldsmith, C. C.|Huang, Ting C.|Jenkins, Ron|Noyan, I. Cev
- Hardcover
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 89.91
£ 40.94 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction .

- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 127.48
£ 20.00 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 784 pages. 10.25x7.00x1.75 inches. In Stock.

- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 121.07
£ 38.50 shippingShips from Germany to U.S.A.Quantity: 2 available
Buch. Condition: Neu. Neuware - 89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.…

- Hardcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
Contact seller5-star sellerCondition: New
£ 91.15
£ 16.01 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.