Zilic Zeljko (60 results)

Hardcover. Condition: As New. Like new, never been used.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: Gut. 1. Ed. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02151 9781402085857 Sprache: Englisch Gewicht in Gramm: 550.

Condition: New.

Condition: New.

Condition: New. In English.

Condition: New. In English.

Condition: New. In English.

Condition: New.

Condition: New.

Condition: New.

Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Condition: As New. Unread book in perfect condition.

Condition: New.

Gebunden. Condition: New.

Condition: New.

Condition: New. Presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. This book brings the results in the direction of merging manufacturing test vector generation and verification. Series: Frontiers in Electronic Testing. Num Pages: 231 pages, biography. BIC Classification: TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 2003. Hardback. . . . . …

Condition: New. pp. 234.

Condition: New. pp. 208.

Condition: New. pp. 208.

Condition: New. pp. 300.

Condition: New. pp. 236.

Condition: New. pp. 300.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be 'imminently doable' by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - 1. DESIGN FLOW Integrated circuit (IC) complexity is steadily increasing. ICs incorporating hundreds of millions of transistors, mega-bit memories, complicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be 'imminently doable' by Intel fellow J. Crawford at Microprocessor Forum in October 2002 [40]. Obviously, designing such complex circuits poses real challenges to engineers. Certainly, no relief comes from the competitive marketplace, with increasing demands for a very narrow window of time (time-to-market) in engineering a ready product. Therefore, a systematic and well-structured approach to designing ICs is a must. Although there are no widely adhered standards for a design flow, most companies have their own established practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefully specified. Ideally, these parameters would not change during the design process. In practice, initial phases of preparing a design specification are susceptible to potential errors, as it is very difficult to grasp all the details in a complex design. …

Paperback. Condition: Brand New. 234 pages. 9.25x6.10x0.54 inches. In Stock.

Condition: New. In English.

Condition: New. Presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. This book brings the results in the direction of merging manufacturing test vector generation and verification. Series: Frontiers in Electronic Testing. Num Pages: 231 pages, biography. BIC Classification: TJFM1. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 509. . 2003. Hardback. . . . . Books ship from the US and Ireland. …

Paperback. Condition: Brand New. 2011 edition. 208 pages. 9.25x6.10x0.23 inches. In Stock.