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Yingxia Liu (21 results)
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Elements of Electromigration : Electromigration in 3d Ic Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Elements of Electromigration : Electromigration in 3d Ic Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Elements Of Electromigration: Electromigration In 3D Ic Technology
Language: English
Published by Taylor & Francis Ltd, 2025
ISBN 10: 1032470283 ISBN 13: 9781032470283
Paperback. Condition: Brand New. 142 pages. 9.68x6.87x9.61 inches. In Stock.
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Condition: As New. Unread book in perfect condition.
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Elements of Electromigration : Electromigration in 3d Ic Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Elements of Electromigration : Electromigration in 3d Ic Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Elements of Electromigration: Electromigration in 3D IC technology
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 102.64
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Hardcover. Condition: Brand New. 184 pages. 9.69x6.88x0.38 inches. In Stock.
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Condition: New. PRINT ON DEMAND.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. King-Ning Tu is Professor Emeritus at UCLA and Chair Professor of Materials and Electrical Engineering of City University of Hong Kong. Professor Tu received his BSc degree from National Taiwan University, MSc degree from Brown University, and PhD.
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. King-Ning Tu is Professor Emeritus at UCLA and Chair Professor of Materials and Electrical Engineering of City University of Hong Kong. Professor Tu received his BSc degree from National Taiwan University, MSc degree from Brown University, and PhD.
