Wong W Eric (91 results)

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  • Language: English

    Published by World Scientific Publishing Comp, 2011

    981434091X / 9789814340915

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    hardcover. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week.

  • Language: English

    Published by Cosmos Books Ltd., Wanchai, Hong Kong, 2007

    9882113435 / 9789882113435

    • Softcover

    Seller: Smith Family Bookstore Downtown, Eugene, OR, U.S.A.Smith Family Bookstore Downtown

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    Trade Paperback. Condition: Very Good. text clean and unmarked. binding tight. covers have very light wear. edges of pages have light wear.

  • Language: English

    Published by Cham, Springer., 2014

    3319017659 / 9783319017655

    Series: Book 115 of 548 - Lecture Notes in Electrical Engineering

    • Hardcover

    Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, GermanyUniversitätsbuchhandlung Herta Hold GmbH

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    xxii, 702 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.

  • Language: English

    Published by World Scientific, 2011

    981434091X / 9789814340915

    • Hardcover

    Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.

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    Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Language: English

    Published by World Scientific, 2011

    981434091X / 9789814340915

    • Hardcover

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  • Language: English

    Published by World Scientific, 2011

    981434091X / 9789814340915

    • Hardcover

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    Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.

  • Language: English

    Published by World Scientific Publishing Company, Incorporated, 2011

    981434091X / 9789814340915

    • Hardcover

    Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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    Condition: New. pp. viii + 299.

  • Language: English

    Published by World Scientific Publishing Company, Incorporated, 2011

    981434091X / 9789814340915

    • Hardcover

    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. pp. viii + 299 Illus.

  • Language: English

    Published by John Wiley and Sons Ltd, Hoboken, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail

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    Paperback. Condition: new. Paperback. Handbook of Software Fault Localization A comprehensive analysis of fault localization techniques and strategies In Handbook of Software Fault Localization: Foundations and Advances, distinguished computer scientists Prof. W. Eric Wong and Prof. T.H. Tse deliver a robust treatment of up-to-date techniques, tools, and essential issues in software fault localization. The authors offer collective discussions of fault localization strategies with an emphasis on the most important features of each approach. The book also explores critical aspects of software fault localization, like multiple bugs, successful and failed test cases, coincidental correctness, faults introduced by missing code, the combination of several fault localization techniques, ties within fault localization rankings, concurrency bugs, spreadsheet fault localization, and theoretical studies on fault localization. Readers will benefit from the authors straightforward discussions of how to apply cost-effective techniques to a variety of specific environments common in the real world. They will also enjoy the in-depth explorations of recent research directions on this topic. Handbook of Software Fault Localization also includes: A thorough introduction to the concepts of software testing and debugging, their importance, typical challenges, and the consequences of poor efforts Comprehensive explorations of traditional fault localization techniques, including program logging, assertions, and breakpoints Practical discussions of slicing-based, program spectrum-based, and statistics-based techniques In-depth examinations of machine learning-, data mining-, and model-based techniques for software fault localization Perfect for researchers, professors, and students studying and working in the field, Handbook of Software Fault Localization: Foundations and Advances is also an indispensable resource for software engineers, managers, and software project decision makers responsible for schedule and budget control. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices

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  • Language: English

    Published by Wiley, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK

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    £ 85.84

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    PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.

  • Condition: Used - Very good

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    Condition: Very Good. Most items will be dispatched the same or the next working day. A copy that has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.

  • Condition: Used - Good

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    Condition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.

  • Language: English

    Published by Springer, 2001

    0792373235 / 9780792373230

    Series: Book 42 of 42 - Advances in Database Systems

    • Hardcover

    Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International

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    Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

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  • Language: English

    Published by Springer, 2001

    0792373235 / 9780792373230

    Series: Book 42 of 42 - Advances in Database Systems

    • Hardcover

    Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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    Condition: New. pp. viii + 118 1st Edition.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: California Books, Miami, FL, U.S.A.California Books

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  • Language: English

    Published by World Scientific Publishing Company, 2011

    981434091X / 9789814340915

    • Hardcover

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  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, 2011

    981434091X / 9789814340915

    • Hardcover

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    HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

  • Language: English

    Published by Springer, 2001

    0792373235 / 9780792373230

    Series: Book 42 of 42 - Advances in Database Systems

    • Hardcover

    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. pp. viii + 118 Illus.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

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  • Language: English

    Published by John Wiley and Sons Ltd, Hoboken, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

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    Paperback. Condition: new. Paperback. Handbook of Software Fault Localization A comprehensive analysis of fault localization techniques and strategies In Handbook of Software Fault Localization: Foundations and Advances, distinguished computer scientists Prof. W. Eric Wong and Prof. T.H. Tse deliver a robust treatment of up-to-date techniques, tools, and essential issues in software fault localization. The authors offer collective discussions of fault localization strategies with an emphasis on the most important features of each approach. The book also explores critical aspects of software fault localization, like multiple bugs, successful and failed test cases, coincidental correctness, faults introduced by missing code, the combination of several fault localization techniques, ties within fault localization rankings, concurrency bugs, spreadsheet fault localization, and theoretical studies on fault localization. Readers will benefit from the authors straightforward discussions of how to apply cost-effective techniques to a variety of specific environments common in the real world. They will also enjoy the in-depth explorations of recent research directions on this topic. Handbook of Software Fault Localization also includes: A thorough introduction to the concepts of software testing and debugging, their importance, typical challenges, and the consequences of poor efforts Comprehensive explorations of traditional fault localization techniques, including program logging, assertions, and breakpoints Practical discussions of slicing-based, program spectrum-based, and statistics-based techniques In-depth examinations of machine learning-, data mining-, and model-based techniques for software fault localization Perfect for researchers, professors, and students studying and working in the field, Handbook of Software Fault Localization: Foundations and Advances is also an indispensable resource for software engineers, managers, and software project decision makers responsible for schedule and budget control. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2001

    0792373235 / 9780792373230

    Series: Book 42 of 42 - Advances in Database Systems

    • Hardcover

    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. pp. viii + 118.

  • Language: English

    Published by Palgrave Macmillan, 2015

    3319111035 / 9783319111032

    Series: Book 149 of 548 - Lecture Notes in Electrical Engineering

    • Hardcover

    Seller: Buchpark, Trebbin, GermanyBuchpark

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    Condition: Sehr gut. Zustand: Sehr gut | Seiten: 1344 | Sprache: Englisch | Produktart: Bücher | This book aims to examine innovation in the fields of computer engineering and networking. The book covers important emerging topics in computer engineering and networking, and it will help researchers and engineers improve their knowledge of state-of-art in related areas. The book presents papers from the 4th International Conference on Computer Engineering and Networks (CENet2014) held July 19-20, 2014 in Shanghai, China.

  • Language: English

    Published by Springer-Verlag New York Inc., New York, NY, 2010

    1441948880 / 9781441948885

    Series: Book 42 of 42 - Advances in Database Systems

    • Softcover
    • First Edition

    Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail

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    Paperback. Condition: new. Paperback. Extensive research and development has produce mutation tools for languages such as Fortran, Ada, C, and IDL; empirical evaluations comparing mutation with other test adequacy criteria; empirical evidence and theoretical justification for the coupling effect; and techniques for speeding up mutation testing using various types of high performance architectures. Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation. Mutation Testing for the New Century brings together cutting edge research results in mutation testing from a wide range of researchers. This book provides answers to key questions related to mutation and raises questions yet to be answered. It is an excellent resource for researchers, practitioners, and students of software engineering. Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation. Mutation Testing for the New Century brings together cutting edge research results in mutation testing from a wide range of researchers. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Language: English

    Published by World Scientific Publishing Co Pte Ltd, 2011

    981434091X / 9789814340915

    • Hardcover

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    HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

  • Language: English

    Published by Wiley-IEEE Computer Society Pr, 2023

    1119291801 / 9781119291800

    • Softcover

    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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