Wk Chim (1 results)

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    • Language: English

      Published by John Wiley & Sons, 2000

      047149240X / 9780471492405

      • Hardcover

      Seller: moluna, Greven, Germanymoluna

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      Condition: New

      £ 206.12

      £ 42.01 shipping 
      Ships from Germany to U.S.A.

      Quantity: Over 20 available

      Gebunden. Condition: New. This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001)The diminishing .