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Wk Chim (1 results)

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  • Language: English

    Published by John Wiley & Sons, 2000

    047149240X / 9780471492405

    • Hardcover

    Seller: moluna, Greven, Germanymoluna

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    Condition: New

    £ 209.16

    £ 40.83 shipping 
    Ships from Germany to U.S.A.

    Quantity: Over 20 available

    Condition: New. This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001)The diminishing .