Semiconductor Device Analysis Using Photon Emission Microscopy

Language: English

Published by John Wiley & Sons, 2000

047149240X / 9780471492405

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This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001)The diminishing .

Seller Inventory # 446916852

Title
Semiconductor Device Analysis Using Photon Emission Microscopy
Author
WK Chim
Publisher
John Wiley & Sons
Publication year
2000
Condition
New
Binding
Gebunden
Language
English
ISBN 10
047149240X
ISBN 13
9780471492405

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 42.01£ 42.01
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