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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
Condition: New. pp. 338 Softcover reprint of the original 1st ed. 2014 edition NO-PA16APR2015-KAP.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 96.88
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Language: English
Published by Springer International Publishing AG, CH, 2014
ISBN 10: 3319032208 ISBN 13: 9783319032207
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Hardback. Condition: New. 2014 ed.
Taschenbuch. Condition: Neu. System Level ESD Protection | Vladislav Vashchenko (u. a.) | Taschenbuch | xviii | Englisch | 2016 | Springer | EAN 9783319348926 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Condition: New. pp. 346.
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Condition: New. pp. 480.
Condition: New. pp. 340.
Language: English
Published by Springer International Publishing, 2014
ISBN 10: 3319032208 ISBN 13: 9783319032207
Seller: moluna, Greven, Germany
Condition: New. Provides a systematic approach to on-chip ESD protection for system-level IC pinsDescribes a system-level co-design methodology, which uses external system level ESD protection components, together with on-chip ESD protection structureInclu.
Taschenbuch. Condition: Neu. Physical Limitations of Semiconductor Devices | Vladislav A. Vashchenko (u. a.) | Taschenbuch | xiii | Englisch | 2010 | Springer | EAN 9781441945051 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Paperback. Condition: Brand New. reprint edition. 340 pages. 9.25x6.10x0.80 inches. In Stock.
Condition: New. pp. 480.
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic failures, impact of local structural inhomo- neities, major principles of physical limitation of safe-operating area (SOA), physical mechanisms of the current instability, filamentation and conductivity modulation in particular device types and architectures. Specifically, the similar principles and regularities are discussed for elect- static discharge (ESD) protection devices, treating them as a particular case of pulsed power devices. Thus both the most intriguing applications and reliability problems in case of the discrete and the integrated components are covered in this book.
Hardcover. Condition: Brand New. 2014 edition. 320 pages. 9.25x6.25x1.00 inches. In Stock.
Paperback. Condition: Like New. Like New. book.
Language: English
Published by Springer International Publishing AG, CH, 2014
ISBN 10: 3319032208 ISBN 13: 9783319032207
Seller: Rarewaves.com UK, London, United Kingdom
Hardback. Condition: New. 2014 ed.
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Taschenbuch. Condition: Neu. ESD Design for Analog Circuits | Vladislav A. Vashchenko (u. a.) | Taschenbuch | xx | Englisch | 2014 | Springer | EAN 9781489997579 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.