Turunen Markus (8 results)
- Hardcover
Seller: medimops, Berlin, Germanymedimops
Contact seller5-star sellerCondition: Used - Very good
£ 4.14
£ 17.11 shippingShips from Germany to U.S.A.Quantity: 11 available
Condition: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.
Interfacial Compatibility in Microelectronics: Moving Away From the Trial and Error Approach (Microsystems) [Hardcover] [Jan 13, 2012] Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T. and Kivilahti, Jorma
Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma
- Hardcover
Seller: StainesBook, Weybridge, SURRE, United KingdomStainesBook
Contact seller1-star sellerCondition: New
£ 81.44
£ 30.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 137.84
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 137.84
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach
Laurila, Tomi/ Vuorinen, Vesa/ Paulasto-kröckel, Mervi/ Turunen, Markus/ Mattila, Toni T.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 192.35
£ 10.00 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 240 pages. 9.20x6.10x0.51 inches. In Stock.
- Hardcover
Seller: Antiquariat Jochen Mohr -Books and Mohr-, Oberthal, GermanyAntiquariat Jochen Mohr -Books and Mohr-
Contact seller5-star sellerCondition: Used - Fine
£ 3.48
£ 51.34 shippingShips from Germany to U.S.A.Quantity: 1 available
hardcover. Condition: Sehr gut. 208 Seiten 9783312010011 Wir verkaufen nur, was wir auch selbst lesen würden. Sprache: Deutsch Gewicht in Gramm: 278.
Interfacial Compatibility in Microelectronics
Tomi Laurila|Vesa Vuorinen|Mervi Paulasto-Kröckel|Markus Turunen|Toni T. Mattila|Jorma Kivilahti
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 120.01
£ 41.92 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides solutions to several common reliability issues in microsystem packagingTeaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materialsCombines thermodynamic-…diffusion kinetic model.
Interfacial Compatibility in Microelectronics
Tomi Laurila|Vesa Vuorinen|Mervi Paulasto-Kröckel|Markus Turunen|Toni T. Mattila|Jorma Kivilahti
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 120.01
£ 41.92 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides solutions to several common reliability issues in microsystem packagingTeaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materialsCombines thermodynamic-…diffusion kinetic model.
