Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)

Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi; Turunen, Markus; Mattila, Toni T.; Kivilahti, Jorma

ISBN 10: 1447160681 ISBN 13: 9781447160687
Published by Springer, 2014
Language: English
Condition: New Soft cover

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