Tripathi Sarvesh (24 results)

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Paperback or Softback. Condition: New. Fundamentals of CAPF Paper 2. Book.

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Taschenbuch. Condition: Neu. Neuware - The UPSC conducts the Central Armed Police Forces (CAPF) Assistant Commandant (AC) examination to recruit dedicated officers for India's CAPFs. Paper 2-focusing on General Studies, Essay, and Comprehension-is a vital component, assessing analytical thinking, language proficiency, and writing skills.This book is thoughtfully designed to meet the specific demands of Paper 2, shaped by my experience with the exam. It offers a structured approach to essay writing, comprehension, précis, and effective communication. With curated essays on contemporary issues, model reports, summaries, and grammar exercises, each chapter progresses from concept clarity to examples, practice sets, and model answers.Whether you're a beginner or a repeat aspirant, this book aims to be your trusted guide. It is dedicated to my father, Late Shri G. S. R. Tripathi (Retd. Judge), with support from my wife, Smt. Noopur Tripathi (IRAS), and insights from my brother, Shri S. Devesh Tripathi, Dy. Commandant, CISF (AIR-27, UPSC 2012). …

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Taschenbuch. Condition: Neu. Exploration of Focused Ion Beam Processing | New nanofabrication stratgies using varioud FIB induced physical phenomena | Sarvesh K Tripathi | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2011 | LAP Lambert Academic Publishing | EAN 9783847333098 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu.…

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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Tripathi Sarvesh KSarvesh K Tripathi received his MSc (2006) and PhD (2010) degrees in Physics from Indian Institute of Technology Kanpur, India. Subsequently he carried out his Post Doctoral Work at Trinity College Dublin, Ireland. .…

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The necessity of miniaturization of the devices expands the scope of nanotechnology. In recent years, researchers have poured in a lot of effort in the development of nanoscale devices. The focused ion beam (FIB) has proven itself as a very powerful and unique technique for nanofabrication. FIB induced micro / nanofabrication fundamentally involves two basic phenomena namely sputtering and molecular cracking, leading to the material removal and material deposition, respectively. In the present work the basic physical processes involved in the FIB induced deposition have been investigated and the correlation between ion beam parameters and physical characteristics of FIB fabricated nanostructures has been studied. There are a number of other physical phenomena viz. scattering, redeposition, secondary electron / photon emission and localized heating etc. which may occur when the incident ions interact with the substrate during the FIB processing, and intricately influence the nanofabrication. Therefore, it is very necessary to investigate the effect of these phenomena for efficient FIB processing. In the present work the influences of these physical phenomena have been explored.…