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Hardcover. Condition: Fine. Leichte Kratzer / Abnutzungen / Druckstellen; Leichte Rillen / Abschürfungen / Risse / Knicke; Gebrochener Buchrücken. This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48)
Book 2 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
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Condition: New. pp. 348.
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Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 103.83
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Kelvin Probe Force Microscopy
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Berlin Heidelberg, 2013
ISBN 10: 3642271138 ISBN 13: 9783642271137
Condition: New.
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Kelvin Probe Force Microscopy
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Berlin Heidelberg, 2011
ISBN 10: 3642225659 ISBN 13: 9783642225659
Condition: New.
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Condition: New. pp. 348.
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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48)
Book 2 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 127.60
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Paperback. Condition: Brand New. 2012 edition. 290 pages. 9.25x6.10x0.79 inches. In Stock.
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Hardcover. Condition: Brand New. 2012 edition. 345 pages. 9.25x6.25x1.00 inches. In Stock.
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Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xiv | Englisch | 2013 | Springer | EAN 9783642271137 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
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Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Vieweg, Springer, 2011
ISBN 10: 3642225659 ISBN 13: 9783642225659
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
-
Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 163.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences, 65)
Book 24 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 168.56
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences, 65)
Book 24 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 168.56
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Hardcover. xxiv, 521 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16212 9783319756868 Sprache: Englisch Gewicht in Gramm: 1050.
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Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
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Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | From Single Charge Detection to Device Characterization | Sascha Sadewasser (u. a.) | Taschenbuch | xxiv | Englisch | 2019 | Springer | EAN 9783030092986 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
Book 24 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer International Publishing, Springer Nature Switzerland, 2019
ISBN 10: 3030092984 ISBN 13: 9783030092986
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
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Hardcover. Condition: Brand New. 521 pages. 9.50x6.25x1.25 inches. In Stock.
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Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
