Kelvin Probe Force Microscopy | From Single Charge Detection to Device Characterization

Book 24 of 30: Springer Series in Surface Sciences

Sascha Sadewasser (u. a.)

ISBN 10: 3030092984 ISBN 13: 9783030092986
Published by Springer, 2019
Language: English
Condition: New Soft cover

Sold by preigu, Osnabrück, Germany

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New - Soft cover

Condition: New

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