Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Book 24 of 30: Springer Series in Surface Sciences

Sadewasser, Sascha (Edited by)/ Glatzel, Thilo (Edited by)

ISBN 10: 3319756869 ISBN 13: 9783319756868
Published by Springer, 2018
Language: English
Condition: New Hardcover

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