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Advanced Model Order Reduction Techniques in VLSI Design
Language: English
Published by Cambridge University Press, 2007
ISBN 10: 0521865816 ISBN 13: 9780521865814
Condition: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.
Language: English
Published by New York, Springer New York., 2012
ISBN 10: 1461407877 ISBN 13: 9781461407874
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
XXIX, 305 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.
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Condition: New. pp. 290.
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Condition: New. pp. 290.
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Condition: New. pp. 290.
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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International EditionCondition: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Advanced Model Order Reduction Techniques in VLSI Design
Language: English
Published by Cambridge University Press CUP, 2007
ISBN 10: 0521865816 ISBN 13: 9780521865814
Condition: New. pp. xviii + 240.
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Advanced Model Order Reduction Techniques in VLSI Design
Language: English
Published by Cambridge University Press, 2007
ISBN 10: 0521865816 ISBN 13: 9780521865814
Condition: New. pp. xviii + 240 Illus.
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Advanced Model Order Reduction Techniques in VLSI Design
Language: English
Published by Cambridge University Press, 2007
ISBN 10: 0521865816 ISBN 13: 9780521865814
Condition: New. pp. xviii + 240.
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Condition: As New. Unread book in perfect condition.
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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Statistical Performance Analysis and Modeling Techniques for Nanometer Vlsi Designs
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Statistical Performance Analysis and Modeling Techniques for Nanometer Vlsi Designs
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 106.02
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New. pp. 336.
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Condition: New. pp. 308.
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VLSI Design
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 129.27
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Advanced Symbolic Analysis for VLSI Systems: Methods and Applications
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
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Add to basketCondition: New. In.
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Advanced Symbolic Analysis for VLSI Systems: Methods and Applications
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New.
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Gebunden. Condition: New.
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Condition: Hervorragend. Zustand: Hervorragend | Seiten: 336 | Sprache: Englisch | Produktart: Bücher | Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in the context of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in thecontext of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. .
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Condition: New. pp. 300.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 320 | Sprache: Englisch | Produktart: Bücher | This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Paperback. Condition: Like New. Like New. book.
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Advanced Model Order Reduction Techniques in VLSI Design
Published by Cambridge University Press, Cambridge, 2007
Seller: Expatriate Bookshop of Denmark, Svendborg, Denmark
Seller rating 5 out of 5 stars
orig.boards Minor rubbing. An ink mrk to bottom page-edge. VG. 26x18cm, xviii,240 pp "Model order reduction (MOR) techniques reduce the complexity of VLSI designs, paving the way to higher operating speeds and smaller feature sizes. This book presents a systematic introduction to, and treatment of, the key MOR methods employed in general linear circuits, using real-world examples to illustrate the advantages and disadvantages of each algorithm. Following a review of traditional projection-based techniques, coverage progresses to advanced 'state-of-the-art' MOR methods for VLSI design, including HMOR, passive truncated balanced realization (TBR) methods, efficient inductance modeling via the VPEC model, and structure-preserving MOR techniques. Where possible, numerical methods are approached from the CAD engineer's perspective, avoiding complex mathematics and allowing the reader to take on real design problems and develop more effective tools. With practical examples and over 100 illustrations, this book is suitable for researchers and graduate students of electrical and computer engineering, as well as practitioners working in the VLSI design industry" - Publisher's description. Minor rubbing. An ink mrk to bottom page-edge. VG.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuitsHelps chip designers .
