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Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings, 788)
Published by American Institute of Physics, 2005
ISBN 10: 0735402779 ISBN 13: 9780735402775
Language: English
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Frontiers Of Characterization And Metrology For Nanoelectronics
Published by American Institute of Physics, 2009
ISBN 10: 0735407126 ISBN 13: 9780735407121
Language: English
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Frontiers of Characterization and Metrology for Nanoelectronics: v. 1173 (AIP Conference Proceedings)
Published by American Institute of Physics, 2009
ISBN 10: 0735407126 ISBN 13: 9780735407121
Language: English
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings, 550)
Published by American Institute of Physics, 2001
ISBN 10: 156396967X ISBN 13: 9781563969676
Language: English
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
Published by American Inst. of Physics, 2005
ISBN 10: 0735402779 ISBN 13: 9780735402775
Language: English
Hardcover. Condition: Like New. Like New. Ships from Multiple Locations. book.
