Frontiers of Characterization and Metrology for Nanoelectronics: v. 1173 (AIP Conference Proceedings) - Hardcover
Synopsis
As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the introduction of new materials, innovative processing and assembly, and novel devices brings formidable metrology challenges. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.
"synopsis" may belong to another edition of this title.
Search results for Frontiers of Characterization and Metrology for Nanoelectron...
Stock Image
Frontiers Of Characterization And Metrology For Nanoelectronics
Published by
American Institute of Physics, 2009
ISBN 10: 0735407126
ISBN 13: 9780735407121
New
Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEOCT25-111279
Stock Image
Frontiers of Characterization and Metrology for Nanoelectronics: v. 1173 (AIP Conference Proceedings)
Published by
American Institute of Physics, 2009
ISBN 10: 0735407126
ISBN 13: 9780735407121
New
Hardcover
Seller: ALLBOOKS1, Direk, SA, Australia
Seller rating 5 out of 5 stars
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Seller Inventory # SHAK111279
Stock Image
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano
Seller: Buchpark, Trebbin, Germany
Seller rating 5 out of 5 stars
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 398 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 6117787/12