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Schrimpf Ronald (37 results)
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Hardcover. Condition: Very Good+. Dust Jacket Condition: No Dust Jacket. Hardcover; no dustjacket, as issued. This is a printed Masters thesis published at the University of Minnesota in 1984. Bound in black buckram. The binding is clean. Pages clean. B&W illustrations. ; 27D; 11" x 8-1/2"; 95 pages.
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Condition: As New. Unread book in perfect condition.
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Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New.
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Condition: New.
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Hardcover. Condition: Very Good+. Dust Jacket Condition: No Dust Jacket. Hardcover; no dustjacket, as issued. This is a printed PHD thesis published at the University of Minnesota in 1986. Bound in black buckram. Signed by the author on the front flyleaf; as"Ron", and inscribed to one of his professors (who is also mentioned first in the acknowledgements. The binding is very clean. Pages clean. B&W illustrations. This is a fairly heavy book; Priority and/or International may require shipping over and above standard costs. ; 27D; 11" x 8-1/2"; 134 pages; Signed by Author.
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Condition: New.
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Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Paperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
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Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Defects in Microelectronic Materials and Devices
Language: English
Published by CRC Press 2019-08-30, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Paperback. Condition: New.
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Defects in Microelectronic Materials and Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 85.36
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Condition: New.
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Paperback. Condition: Brand New. 770 pages. 10.00x7.00x1.75 inches. In Stock.
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Co Pte Ltd, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Co Pte Ltd, SG, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
£ 183.12
Free Shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
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RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES (Selected Topics in Electronics and Systems)
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Defects in Microelectronic Materials and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Condition: New.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Co Pte Ltd, SG, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
£ 168.29
£ 65 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
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Condition: New. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
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Hardcover. Condition: Brand New. 1st edition. 792 pages. 10.00x7.10x1.50 inches. In Stock.
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Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
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Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Inc Nov 2008, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Buch. Condition: Neu. Neuware - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
