Defects in Microelectronic Materials and Devices

Language: English

Published by CRC Press, 2008

1420043765 / 9781420043761

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Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.

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Title
Defects in Microelectronic Materials and Devices
Author
Fleetwood, Daniel M.
Publisher
CRC Press
Publication year
2008
Condition
New
Binding
Hardcover
Language
English
ISBN 10
1420043765
ISBN 13
9781420043761

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 42.11£ 42.11
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