Pol Jaco (33 results)
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Formal Methods: Applications and Technology: 11th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2006, and 5th . / Programming and Software Engineering)
Brim, Lubos [Editor]; Haverkort, Boudewijn [Editor]; Leucker, Martin [Editor]; Pol, Jaco van de [Editor];
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Published by Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin 2010
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Paperback. Condition: new. Paperback. This volume contains the proceedings of the 17th International SPIN Workshop on Model Checking Software (SPIN 2010). The workshop was organized by and held at the University of Twente, The Netherlands, on 27-29 September 2010. The workshop was co-located with the 5th International Conference… on Graph Transformation (ICGT 2010) and several of its satellite workshops, and with the joint PDMC and HiBi workshops, on Parallel and Distributed Methods for veri?Cation and on High-performance computational systems Biology. The SPIN workshopis a forum for practitioners and researchersinterested in state-spaceanalysisofsoftware-intensivesystems.Thisisapplicableinparticular to concurrent and asynchronous systems, including protocols. The name of the workshop re?ects the SPIN model checking tool by Gerard J. Holzmann, which won the ACM System Software Award 2001, and is probably the most widely used industrial-strength model checker around. The focus of the workshop is on theoretical advances and extensions, al- rithmic improvements, and empirical evaluation studies of (mainly) state-based modelcheckingtechniques,asimplementedintheSPINmodelcheckerandother tools.The workshop encourages interaction and exchange of ideas with all - lated areas in software engineering. To this end, we co-located SPIN 2010 with the graph transformation, and high-performance analysis communities. This year, we received 33 submissions, divided between 29 regular and 4 tool papers.Eachpaperwasrigorouslyreviewedbyatleastfourreviewers,andjudged onitsqualityandits signi?canceandrelevanceforSPIN.Weaccepted13regular papers, and 2 tool papers for presentation and for publication in this volume. Constitutes the refereed proceedings of the 17th International SPIN workshop on Model Checking Software, SPIN 2010, that was held at the University of Twente, in Enschede, The Netherlands. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Integrated Formal Methods : 5th International Conference, Ifm 2005, Eindhoven, the Netherlands, November 29 - December 2, 2005. Proceedings
Romijn, Judi M. T. (EDT); Smith, Graeme (EDT); Van De Pol, Jaco C. (EDT); International Conference on Integrated F; Smith, Graeme; Pol, Jaco Van De
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Integrated Formal Methods : 5th International Conference, Ifm 2005, Eindhoven, the Netherlands, November 29 - December 2, 2005. Proceedings
Romijn, Judi M. T. (EDT); Smith, Graeme (EDT); Van De Pol, Jaco C. (EDT); International Conference on Integrated F; Smith, Graeme; Pol, Jaco Van De
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Condition: New. Up to date resultsFast conference proceedingsState-of-the-art reportSatisfiability Modulo Theories for Model Checking.- SMT-Based Software Model Checking.- Symbolic Object Code Analysis.- Model Checking in Context.- Experimental Com.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - These are the joint nal proceedings of the 11th International Workshop on Formal Methods for Industrial Critical Systems (FMICS 2006) and the fth International Workshop on Parallel and Distributed Methods in Veri cation (PDMC 2006). Both workshops…were organized as satellite events of CONCUR 2006, the 17th International Conference on Concurrency Theory that was or- nized in Bonn, August 2006. The FMICS workshop continued successfully the aim of the FMICS working group - to promote the use of formal methods for industrial applications, by supporting research in this area and its application in industry. The emphasis in these workshops is on the exchange of ideas between researchers and prac- tioners, in both industry and academia. This year the Program Committee received a record number of submissions. The 16 accepted regular contributions and 2 accepted tool papers, selected out of a total of 47 submissions, cover formal methodologies for handling large state spaces, model-based testing, formal description and analysis techniques as well as a range of applications and case studies. The workshop program included two invited talks, by Anna Slobodova from Intel on 'Challenges for Formal Veri cation in an Industrial Setting' and by Edward A. Lee from the University of California at Berkeley on 'Making C- currency Mainstream.' The former full paper can be found in this volume.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year s IFM was held in…December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedingscontain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very rst commandment Thou shalt choose an appropriate - tation touches the heart of the IFM theme: Complex systems have di erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods being able to specify and verify the correctness of complete systems islost.
- Softcover
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Taschenbuch. Condition: Neu. Integrated Formal Methods | 5th International Conference, IFM 2005, Eindhoven, The Netherlands, November 29 - December 2, 2005. Proceedings | Judi M. T. Romijn (u. a.) | Taschenbuch | xi | Englisch | 2005 | Springer | EAN 9783540304920 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tierga…rtenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. Formal Methods: Applications and Technology | 11th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2006, and 5th International Workshop on Parallel and Distributed Methods in Verification, PDMC 2006, Bonn, Germany, August 26-27, and August 31, 2006, Revi | Lubos Brim (…u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2007 | Springer | EAN 9783540709510 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.
Integrated Formal Methods : 5th International Conference, Ifm 2005, Eindhoven, the Netherlands, November 29 - December 2, 2005. Proceedings
Romijn, Judi M. T. (EDT); Smith, Graeme (EDT); Van De Pol, Jaco C. (EDT); International Conference on Integrated F; Smith, Graeme; Pol, Jaco Van De
- Softcover
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- Softcover
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- Softcover
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 261 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Integrated Formal Methods : 5th International Conference, Ifm 2005, Eindhoven, the Netherlands, November 29 - December 2, 2005. Proceedings
Romijn, Judi M. T. (EDT); Smith, Graeme (EDT); Van De Pol, Jaco C. (EDT); International Conference on Integrated F; Smith, Graeme; Pol, Jaco Van De
- Softcover
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- Softcover
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Taschenbuch. Condition: Neu. Neuware - This volume contains the proceedings of the 17th International SPIN Workshop on Model Checking Software (SPIN 2010). The workshop was organized by and held at the University of Twente, The Netherlands, on 27 29 September 2010. The workshop was co-located with the 5th International Conferenc…e on Graph Transformation (ICGT 2010) and several of its satellite workshops, and with the joint PDMC and HiBi workshops, on Parallel and Distributed Methods for veri Cation and on High-performance computational systems Biology. The SPIN workshopis a forum for practitioners and researchersinterested in state-spaceanalysisofsoftware-intensivesystems.Thisisapplicableinparticular to concurrent and asynchronous systems, including protocols. The name of the workshop re ects the SPIN model checking tool by Gerard J. Holzmann, which won the ACM System Software Award 2001, and is probably the most widely used industrial-strength model checker around. The focus of the workshop is on theoretical advances and extensions, al- rithmic improvements, and empirical evaluation studies of (mainly) state-based modelcheckingtechniques,asimplementedintheSPINmodelcheckerandother tools. The workshop encourages interaction and exchange of ideas with all - lated areas in software engineering. To this end, we co-located SPIN 2010 with the graph transformation, and high-performance analysis communities. This year, we received 33 submissions, divided between 29 regular and 4 tool papers.Eachpaperwasrigorouslyreviewedbyatleastfourreviewers,andjudged onitsqualityandits signi canceandrelevanceforSPIN.Weaccepted13regular papers, and 2 tool papers for presentation and for publication in this volume.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year s…IFM was held in December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedingscontain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very rst commandment Thou shalt choose an appropriate - tation touches the heart of the IFM theme: Complex systems have di erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods being able to specify and verify the correctness of complete systems islost. 424 pp. Englisch.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the thoroughly refereed joint post-proceedings of the two International Workshops on Formal Methods for Industrial Critical Systems, FMICS 2006, and on Parallel and Distributed Methods in Verification, PDMC 200…6, held in Bonn, Germany in August 2006 in the course of the 17th International Conference on Concurrency Theory, CONCUR 2006. 376 pp. Englisch.
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Formal Methods: Applications and Technology
Brim, Lubos|Haverkort, Boudewijn|Leucker, Martin|Pol, Jaco van de
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the thoroughly refereed joint post-proceedings of the two International Workshops on Formal Methods for Industrial Critical Systems, FMICS 2006, and on Parallel and Distributed Methods in Verific…ation, PDMC 2006, held in Bonn, Germa.
