Nicolaidis Michael (54 results)
- Softcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
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£ 73.51
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Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9781441950338.
Language: English
Published by Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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£ 96.88
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Condition: New. In.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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£ 96.88
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Condition: New. In.
Language: English
Published by Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 113.07
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Condition: New.
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 113.08
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- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 96.87
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Condition: New.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Book Dispensary, Concord, ON, CanadaBook Dispensary
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£ 119.56
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Hardcover. Condition: New. BRAND NEW hardcover. Book.
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 125.90
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Condition: New. pp. 164.
Language: English
Published by Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 125.97
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Condition: New. pp. 168.
Language: English
Published by Kluwer Academic Publishers, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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£ 118.35
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Condition: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .
On Line-Testing for VLSI
Nicolaidis, Michael (Edited by)/ Zorian, Yervant (Edited by)/ Pradhan, Dhiraj K. (Edited by)
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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£ 128.32
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Paperback. Condition: Brand New. 164 pages. 11.00x8.25x0.37 inches. In Stock.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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£ 84.03
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Taschenbuch. Condition: Neu. On-Line Testing for VLSI | Michael Nicolaidis (u. a.) | Taschenbuch | Frontiers in Electronic Testing | iv | Englisch | 2010 | Springer | EAN 9781441950338 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbiet…er: preigu.
Language: English
Published by Kluwer Academic Publishers, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 145.27
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Condition: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicola…idis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . . Books ship from the US and Ireland.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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£ 137.84
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Condition: New. In.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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£ 99.48
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of… concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Language: English
Published by Springer, Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 100.89
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concur…rent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 156.52
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Condition: New.
Language: English
Published by Springer US, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
Contact seller5-star sellerCondition: Used - Very good
£ 69.30
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Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurren…t error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
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£ 163.52
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- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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£ 137.00
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Paperback. Condition: Like New. Like New. book.
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 144.99
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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£ 140.00
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 169.04
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 1998
Series: Frontiers in Electronic Testing, Book 33 of 40. Book 33 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 172.22
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 172.53
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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£ 131.49
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Taschenbuch. Condition: Neu. Soft Errors in Modern Electronic Systems | Michael Nicolaidis | Taschenbuch | Frontiers in Electronic Testing | xviii | Englisch | 2012 | Springer | EAN 9781461426899 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]c…om | Anbieter: preigu.
Language: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 196.51
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Condition: New. pp. 336.
Language: English
Published by Springer, Humana, 2012
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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£ 158.46
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physica…l mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Language: English
Published by Springer Us, 2010
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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£ 158.46
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mecha…nisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Language: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 23 of 40. Book 23 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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£ 192.00
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
