Martorell Ferran (11 results)
- Softcover
Seller: AG Library, Malaga, MA, SpainAG Library
Contact seller4-star sellerCondition: New
£ 17.74
£ 14.97 shippingShips from Spain to U.S.A.Quantity: 1 available
Condition: New. Idioma/Language: Español. Un poderoso recordatorio de que los derechos se conquistan entre todos Militantes de base y escritoras, periodistas y mariscadoras, mujeres dedicadas a «sus labores», alcaldes, una traductora, una violinista o una trabajadora de fábrica que habría querido ser actriz. Personas republicana…s o monárquicas, con militancia política o luchadoras sin plena conciencia de serlo; anticlericales o profundamente católicas; de clase media y espíritu cosmopolita o arraigadas a su barrio y a su pueblo. El abanico de protagonistas de estas Historias ciudadanas es tan amplio como las sociedades y los tiempos que recorren, desde finales del siglo XIX hasta los inicios del XXI. En esta obra coral, los historiadores Miguel Martorell, María Muñoz Sanz-Agero, Irene Mendoza, Alejandro Camino, Ferran Gómez Albentosa, Elia Blanco, Fátima Martínez Pazos y Pilar Mera Costas trazan una historia paralela de la defensa de la democracia, en la que la lucha por los derechos y las libertades se cuenta desde la base o desde la segunda fila de la movilización política y social, rescatando vidas corrientes en los márgenes de la historiografía, personajes «secundarios, algo oscuros». Gente común unida por el hilo invisible de su infatigable lucha por nuestras libertades. *** Nota: Los envíos a España peninsular, Baleares y Canarias se realizan a través de mensajería urgente. No aceptamos pedidos con destino a Ceuta y Melilla.
Language: English
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG 2011
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 81.44
£ 3.02 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 148.
Published by Institució Alfons el Magnànim/Diputació de València 1984
- Softcover
Seller: Librería Vobiscum, SAN VICENTE DEL RASPEIG, A, SpainLibrería Vobiscum
Contact seller5-star sellerCondition: Used - Very good
£ 22.33
£ 26.84 shippingShips from Spain to U.S.A.Quantity: 1 available
Condition: Bueno. València 1984. Institució Alfons el Magnànim/Diputació de València. Col.lecció IAM Investigació nº 4. 186 pp. 21x16. Rústica. Firma anterior propietario. Texto en valenciano.
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
£ 45.56
£ 60.71 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Fault-tolerant Cells for Nanoelectronic Computing | Designing the building blocks for reliable nanoelectronic systems using a hierarchical tolerant approach | Ferran Martorell | Taschenbuch | 148 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783844319545 | Verantwortliche Person für d…ie EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 116.00
£ 25.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by LAP LAMBERT Academic Publishing Mai 2011 2011
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
Contact seller5-star sellerCondition: New
£ 52.70
£ 19.95 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density co…mes at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems. 148 pp. Englisch.
- Softcover
- Print on Demand
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
£ 43.33
£ 42.49 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Martorell FerranF.Martorell is PhD in electronic engineering (Polytechnic University of Catalonia). He has a long experience in new technologies research from nanoelectronic technologies to asynchronous… systems both at university .
Language: English
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG 2011
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 82.14
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 148 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
Language: English
Published by VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG 2011
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 85.13
£ 8.63 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 148.
Language: English
Published by LAP LAMBERT Academic Publishing Mai 2011 2011
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
Contact seller5-star sellerCondition: New
£ 52.70
£ 52.04 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes…at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 148 pp. Englisch.
- Softcover
- Print on Demand
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 52.70
£ 53.07 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes a…t the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.
