Ferran Martorell (11 results)

Condition: New. Idioma/Language: Español. Un poderoso recordatorio de que los derechos se conquistan entre todos Militantes de base y escritoras, periodistas y mariscadoras, mujeres dedicadas a «sus labores», alcaldes, una traductora, una violinista o una trabajadora de fábrica que habría querido ser actriz. Personas republicanas o monárquicas, con militancia política o luchadoras sin plena conciencia de serlo; anticlericales o profundamente católicas; de clase media y espíritu cosmopolita o arraigadas a su barrio y a su pueblo. El abanico de protagonistas de estas Historias ciudadanas es tan amplio como las sociedades y los tiempos que recorren, desde finales del siglo XIX hasta los inicios del XXI. En esta obra coral, los historiadores Miguel Martorell, María Muñoz Sanz-Agero, Irene Mendoza, Alejandro Camino, Ferran Gómez Albentosa, Elia Blanco, Fátima Martínez Pazos y Pilar Mera Costas trazan una historia paralela de la defensa de la democracia, en la que la lucha por los derechos y las libertades se cuenta desde la base o desde la segunda fila de la movilización política y social, rescatando vidas corrientes en los márgenes de la historiografía, personajes «secundarios, algo oscuros». Gente común unida por el hilo invisible de su infatigable lucha por nuestras libertades. *** Nota: Los envíos a España peninsular, Baleares y Canarias se realizan a través de mensajería urgente. No aceptamos pedidos con destino a Ceuta y Melilla.

Condition: New. pp. 148.

Condition: Bueno. València 1984. Institució Alfons el Magnànim/Diputació de València. Col.lecció IAM Investigació nº 4. 186 pp. 21x16. Rústica. Firma anterior propietario. Texto en valenciano.

Taschenbuch. Condition: Neu. Fault-tolerant Cells for Nanoelectronic Computing | Designing the building blocks for reliable nanoelectronic systems using a hierarchical tolerant approach | Ferran Martorell | Taschenbuch | 148 S. | Englisch | 2011 | LAP LAMBERT Academic Publishing | EAN 9783844319545 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems. 148 pp. Englisch.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Martorell FerranF.Martorell is PhD in electronic engineering (Polytechnic University of Catalonia). He has a long experience in new technologies research from nanoelectronic technologies to asynchronous systems both at university .

Condition: New. Print on Demand pp. 148 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

Condition: New. PRINT ON DEMAND pp. 148.

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 148 pp. Englisch.

Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - New nanometric technologies hold the promise of device integration density increases of several orders of magnitude and, accordingly, an increase of system performance and functionality. However, this improved integration density comes at the cost of a dramatic reduction of several orders of magnitude on the device quality and, in general, on the operation reliability of circuits. The causes for this increased error rate are inherent to the device's dimensions. It is widely acknowledged that fault and defect tolerant strategies will be required in future nanoelectronic systems. This book analyzes the aggression sources causing the increased fault rates and how they affect the reliability of logic gate operation. From this analysis a new logic cell structure is designed and analyzed. The cell is proposed to be used as the building block for a hierarchical approach to fault-tolerant nanoelectronic architectures. This book will be especially useful for researchers and engineers working in the development of nanoelectronic systems.