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J Nellist (13 results)
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Soft cover. Condition: Very Good. 2nd imp PB with illustrated colour cover and no inscriptions. Pages are clean and tight. 94pp. incl figs.
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How to Give Invertebrates a Higher Profile in Conservation
Published by Joint Committee for the Conservation of British Invertebrates, 1998
Seller: PEMBERLEY NATURAL HISTORY BOOKS BA, ABA, Iver, United Kingdom
Association Member: ABA ILAB PBFA
Seller rating 5 out of 5 stars
Condition: Very Good. 74, . . PB. Vg. From the library of one of the editors, David R. Nellist, with his name to front cover. Proceedings of the Second JCCBI Conference, Peterborough, 27 September 1997.
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Kartoniert / Broschiert. Condition: New. JOHN G. NELLIST led the development and implementation of fiber optic technology into the British Columbia telephone network as General Transmission Engineering Manager at Telus (formerly BC Telecom). He was appointed overall coordinator for the first field.
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Scanning Transmission Electron Microscopy: Imaging and Analysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 168.56
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Scanning Transmission Electron Microscopy
Language: English
Published by Springer-Verlag New York Inc., US, 2011
ISBN 10: 1441971998 ISBN 13: 9781441971999
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
£ 224.86
Free Shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. 2011 ed.
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Condition: New.
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£ 205.66
£ 65 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback. Condition: New. 2011th.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis.The authors willpresent examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will bea comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
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Hardcover. Condition: Brand New. 774 pages. 10.10x7.20x1.60 inches. In Stock.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. - Provides the first comprehensive treatment of the physics and applications of this mainstream technique for imaging and analysis at the atomic level - Presents applications of STEM in condensed matter physics, materials science, catalysis, and n.
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Scanning Transmission Electron Microscopy
Language: English
Published by Springer, Humana Mär 2011, 2011
ISBN 10: 1441971998 ISBN 13: 9781441971999
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis.The authors willpresent examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will bea comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy. 776 pp. Englisch.
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Scanning Transmission Electron Microscopy
Language: English
Published by Springer, Humana Mär 2011, 2011
ISBN 10: 1441971998 ISBN 13: 9781441971999
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Electron Optics and Aberration Correction.- Fundamentals of Scattering Theory.- Image formation in STEM.- Electron energy loss spectroscopy.- Energy dispersive x-ray analysis.- STEM of complex oxides.- STEM of complex alloys.- STEM of catalysts.- STEM of semiconductor devices.- STEM of ceramic materials.- STEM of quasicrystals.- STEM of nanomaterials.- 3D STEM: tomography.- 3D STEM: depth slicing.- Nanobeam diffraction.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 776 pp. Englisch.
