Order Total (1 Item Items):
Shipping Destination:
Fleetwood Daniel (39 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (39)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (29)
- As New, Fine or Near Fine (7)
- Very Good or Good (2)
- Fair or Poor (1)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (3)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (12)
- Not Print on Demand (32)
Language (2)
Free Shipping
Seller Location
Seller Rating
-
Condition: As New. Unread book in perfect condition.
-
Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Condition: New.
-
Condition: New.
-
Condition: New.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Paperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
-
Defects in Microelectronic Materials and Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by CRC Press 2019-08-30, 2019
ISBN 10: 0367386399 ISBN 13: 9780367386399
Paperback. Condition: New.
-
Condition: New. 1st edition NO-PA16APR2015-KAP.
-
Defects in Microelectronic Materials and Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 85.36
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Condition: New.
-
Paperback. Condition: Brand New. 770 pages. 10.00x7.00x1.75 inches. In Stock.
-
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Condition: As New. Unread book in perfect condition.
-
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 136.46
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 138.17
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES (Selected Topics in Electronics and Systems)
Language: English
Published by World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
-
Condition: New.
-
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Defects in Microelectronic Materials and Devices
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: English
Published by World Scientific Pub Co Inc, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Paperback. Condition: Brand New. 338 pages. 9.75x6.50x0.75 inches. In Stock.
-
Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Defects in Microelectronic Materials And Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Condition: As New. Unread book in perfect condition.
-
Condition: New. Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. SchrimpfUncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
-
Hardcover. Condition: Brand New. 1st edition. 792 pages. 10.00x7.10x1.50 inches. In Stock.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Group, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Condition: New. pp. 770.
-
Defects in Microelectronic Materials and Devices
Language: English
Published by Taylor & Francis Inc Nov 2008, 2008
ISBN 10: 1420043765 ISBN 13: 9781420043761
Buch. Condition: Neu. Neuware - Focusing primarily on silicon-based microelectronics, Defects in Microelectronic Materials and Devices provides a comprehensive overview of recent progress made in understanding the effects of electrically active defects in microelectronic materials. The book places particular emphasis on defects that limit device quality, reliability, manufacturability, and radiation response. Notable theorists and researchers present their perspectives on defects in insulators and in semiconductors as well as hydrogen and defect-related failure mechanisms. The text also discusses compound semiconductor materials for microelectronic applications and examines new information garnered from physics and engineering models.
-
Manufacture of dies or moulds used for stamping, pressing or moulding metal, glass or other material capable of being so treated. being Patent Number: 2438 published: 22 September 1866
Published by London Eyre and Spottiswood published at the Great Seal Patent Office c, 1866
First Edition
no binding. Condition: good. First Edition. Original Printed patent disbound with printed front blue wrapper present but not the back wrapper (both often lacking in early patents) About 27cm by 18cm some wear and tear due to the disbinding.
